Studies of probe tip materials by atomic force microscopy: a review

• Ke Xu and
• Yuzhe Liu

Beilstein J. Nanotechnol. 2022, 13, 1256–1267, doi:10.3762/bjnano.13.104

• the direction of new probes and further promotes the broader and deeper application of scanning probe microscope (SPM). Keywords: AFM; carbon nanotube probe; colloid probe; metal probe; Introduction AFM represents a well-established technique for the investigation of the nanosurface morphology

• disadvantages of the improved probes compared with ordinary probes by comparing the differences in performance in terms of spatial resolution, sensitivity, and imaging, and finally provides an outlook on the future development of AFM probes. Review Metal probe Metal nanocluster probe Metal nanoclusters contain

Kelvin probe force microscopy in liquid using electrochemical force microscopy

• Liam Collins,
• Stephen Jesse,
• Jason I. Kilpatrick,
• Alexander Tselev,
• M. Baris Okatan,
• Sergei V. Kalinin and
• Brian J. Rodriguez

Beilstein J. Nanotechnol. 2015, 6, 201–214, doi:10.3762/bjnano.6.19

• material under investigation and the environment in which the measurement is performed, the CPD can then be related to various electrostatic and electrochemical properties. For example, in the case of a metal probe with known work function in vacuum, the CPD provides a measurement of the work function of